精确测量抗反射涂层厚度的最常见方法是使用椭圆偏振技术,它可以观察偏振光的反射方式。
测量抗反射涂层的一种简单方法是通过观察薄膜颜色。1
薄膜的颜色受到厚度和折射率的影响,因此薄膜颜色只是厚度的粗略指导。有多个表用于确定二氧化硅或氮化硅膜的膜厚度,如下所示。制作薄膜标准是很常见的,这样可以通过将样品与标准进行比较来快速检测工艺条件的变化。
荧光灯下二氧化硅 (SiO2) 薄膜的色卡2
Film Thickness (µm) |
Colour and Comments |
---|---|
0.05 | Tan |
0.07 | Brown |
0.10 | Dark violet to red violet |
0.12 | Royal Blue |
0.15 | Light blue to metallic blue |
0.17 | Metallic to very light yellow green |
0.20 | Light gold to yellow; slightly metallic |
0.22 | Gold with slight yellow orange |
0.25 | Orange to melon |
0.27 | Red violet |
0.30 | Blue to violet blue |
0.31 | Blue |
0.32 | Blue to blue green |
0.34 | Light green |
0.35 | Green to yellow green |
0.36 | Yellow green |
0.37 | Green yellow |
0.39 | Yellow |
0.41 | Light orange |
0.42 | Carnation pink |
0.44 | Violet red |
0.46 | Red violet |
0.47 | Violet |
0.48 | Blue violet |
0.49 | Blue |
0.50 | Blue green |
0.52 | Green (broad) |
0.54 | Yellow green |
0.56 | Green yellow |
0.57 | "Yellowish" (actually at times appears to be light creamy gray or metallic) |
0.58 | Light orange or yellow to pink borderline |
0.60 | Carnation pink |
0.63 | Violet red |
0.68 | "Bluish" (actually appears more like a mixture between violet red and blue green and looks grayish) |
0.72 | Blue green to green (quite broad) |
0.77 | "Yellowish" |
0.80 | Orange (rather broad for orange) |
0.82 | Salmon |
0.85 | Dull, light red violet |
0.86 | Violet |
0.87 | Blue violet |
0.89 | Blue |
0.92 | Blue green |
0.95 | Dull yellow green |
0.97 | Yellow to "yellowish" |
0.99 | Orange |
1.00 | Carnation pink |
1.02 | Violet red |
1.05 | Red violet |
1.06 | Violet |
1.07 | Blue violet |
1.10 | Green |
1.11 | Yellow green |
1.12 | Green |
1.18 | Violet |
1.19 | Red Violet |
1.21 | Violet red |
1.24 | Carnation pink to salmon |
1.25 | Orange |
1.28 | "Yellowish" |
1.32 | Sky blue to green blue |
1.40 | Orange |
1.45 | Violet |
1.46 | Blue violet |
1.50 | Blue |
1.54 | Dull yellow green |
- 1. , “Electronic color charts for dielectric films on silicon”, Optics Express, vol. 12, pp. 1464–1469, 2004.
- 2. , “Nondestructive determination of thickness and refractive index of transparent films”, IBM Journal of Research Devices, vol. 8, pp. 43–51, 1964.