Biblio

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Author Title [ Type(Desc)] Year
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Journal Article
J. C. C. Tsai, “Shallow phosphorus diffusion profiles in silicon”, Proceedings of the IEEE, vol. 57, no. 9, pp. 1499 - 1506, 1969.
P. P. Altermatt, Kiesewetter, T., Ellmer, K., and Tributsch, H., “Specifying targets of future research in photovoltaic devices containing pyrite (FeS2) by numerical modelling”, Solar Energy Materials and Solar Cells, vol. 71, no. 2, pp. 181 - 195, 2002.
M. Calixto-Rodriguez, Martinez, H., Sanchez-Juarez, A., Campos-Alvarez, J., Tiburcio-Silver, A., and Calixto, M. E., “Structural, optical, and electrical properties of tin sulfide thin films grown by spray pyrolysis”, Thin Solid Films, vol. 517, no. 7, pp. 2497 - 2499, 2009.
F. C. Nix and Treptwo, A. W., “A Thallous Sulphide Photo EMF Cell”, Journal Opt. Society of America, vol. 29, p. 457, 1939.
P. Zwolenski, Tobola, J., and Kaprzyk, S., “A Theoretical Search for Efficient Dopants in Mg2X (X = Si, Ge, Sn) Thermoelectric Materials”, Journal of Electronic Materials, vol. 40, no. 5, pp. 889 - 897, 2011.
J. -ichi Tani and Kido, H., “Thermoelectric properties of Bi-doped Mg2Si semiconductors”, Physica B: Condensed Matter, vol. 364, no. 1-4, pp. 218 - 224, 2005.
A. Rumberg, Sommerhalter, C., Toplak, M., Jäger-Waldau, A., and Lux-Steiner, M. C., “ZnSe thin films grown by chemical vapour deposition for application as buffer layer in CIGSS solar cells”, Thin Solid Films, vol. 361-362, pp. 172 - 176, 2000.
Miscellaneous
W. R. Thurber, Mattis,, Liu,, and Filliben, “The Relationship Between Resistivity and Dopant Density for Phosphorus- and Boron-Doped Silicon”. U.S. Department of Commerce National Bureau of Standards, 1981.

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