Biblio
«On the use of a bias-light correction for trapping effects in photoconductance-based lifetime measurements of silicon», Journal of Applied Physics, vol. 89, pp. 2772-2778, 2001.
, «The Recombination Parameter J0», Energy Procedia, vol. 55, pp. 53 - 62, 2014.
«A Quasi-Steady-State Open-Circuit Voltage Method for Solar Cell Characterization», en 16th European Photovoltaic Solar Energy Conference, Glasgow, Scotland, 2000, pp. 1152–1155.
, «Improved quantitative description of Auger recombination in crystalline silicon», Physical Review B, vol. 86, n.º 16, 2012.
, «Generalized analysis of quasi-steady-state and transient decay open circuit voltage measurements», Journal of Applied Physics, vol. 91, p. 399, 2002.
, «General parameterization of Auger recombination in crystalline silicon», Journal of Applied Physics, vol. 91, pp. 2473-2480, 2002.
, «Contactless determination of current–voltage characteristics and minority-carrier lifetimes in semiconductors from quasi-steady-state photoconductance data», Applied Physics Letters, vol. 69, pp. 2510-2512, 1996.
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