On the use of a bias-light correction for trapping effects in photoconductance-based lifetime measurements of silicon

Submitted by drupal on Sat, 04/28/2012 - 22:47

D. Macdonald, Sinton, R. A., y Cuevas, A., «On the use of a bias-light correction for trapping effects in photoconductance-based lifetime measurements of silicon», Journal of Applied Physics, vol. 89, pp. 2772-2778, 2001.

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