Biblio
“On the use of a bias-light correction for trapping effects in photoconductance-based lifetime measurements of silicon”, Journal of Applied Physics, vol 89, pp 2772-2778, 2001.
, “Generalized analysis of quasi-steady-state and transient decay open circuit voltage measurements”, Journal of Applied Physics, vol 91, p 399, 2002.
, “Contactless determination of current–voltage characteristics and minority-carrier lifetimes in semiconductors from quasi-steady-state photoconductance data”, Applied Physics Letters, vol 69, pp 2510-2512, 1996.
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