Biblio

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2006
D. Schroder, Semiconductor material and device characterization, 3rd editionrd ed. Piscataway NJ; Hoboken N.J.: IEEE Press; Wiley, 2006.
2005
R. M. Swanson, Approaching the 29% limit efficiency of silicon solar cells, Thirty-First IEEE Photovoltaic Specialists Conference. 01/2005, Lake buena Vista, FL, USA, pp. 889-94, 2005.
K. Bothe, Sinton, R., and Schmidt, J., Fundamental boron-oxygen-related carrier lifetime limit in mono- and multicrystalline silicon, Progress in Photovoltaics: Research and Applications, vol. 13, pp. 287 - 296, 2005.
K. Bothe, Sinton, R., and Schmidt, J., Fundamental boron-oxygen-related carrier lifetime limit in mono- and multicrystalline silicon, Progress in Photovoltaics: Research and Applications, vol. 13, pp. 287 - 296, 2005.
1997
R. Einhaus, Vazsonyi, E., Szlufcik, J., Nijs, J., and Mertens, R., Isotropic texturing of multicrystalline silicon wafers with acidic texturing solutions, Twenty Sixth IEEE Photovoltaic Specialists Conference. New York, NY, USA, pp. 167-170, 1451, 1997.
J. Szlufcik, Sivoththaman, S., Nlis, J. F., Mertens, R. P., and Van-Overstraeten, R., Low-cost industrial technologies of crystalline silicon solar cells, Proceedings-of-the-IEEE, vol. 85. pp. 711-730, 1997.
J. Szlufcik, Sivoththaman, S., Nlis, J. F., Mertens, R. P., and Van-Overstraeten, R., Low-cost industrial technologies of crystalline silicon solar cells, Proceedings-of-the-IEEE, vol. 85. pp. 711-730, 1997.
R. Chandramohan, Sanjeeviraja, C., and Mahalingam, T., Preparation of Zinc Selenide Thin Films by Electrodeposition Technique for Solar Cell Applications, physica status solidi (a), vol. 163, no. 2, pp. R11 - R12, 1997.
J. Horzel, Szlufcik, J., Nijs, J., and Mertens, R., A simple processing sequence for selective emitters, Twenty Sixth IEEE Photovoltaic Specialists Conference. New York, NY, USA, pp. 139-142, 1997.
K. Fukui, Inomata, Y., and Shirasawa, K., Surface texturing using reactive ion etching for multicrystalline silicon solar cells, Twenty Sixth IEEE Photovoltaic Specialists Conference. New York, NY, USA, pp. 1451, 47-50, 1997.

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