Biblio
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“A Sensitivity Analysis of the Spectral Mismatch Correction Procedure Using Wavelength-Dependent Error Sources”, 22nd IEEE PV Specialists Conference. 1991.
, Semiconductor material and device characterization, 3rd editionrd ed. Piscataway NJ; Hoboken N.J.: IEEE Press; Wiley, 2006.
, “Semiconductor Devices, Chapter 8”, New Jersey: Van Nostrand, 1959.
, “Self-consistent optical parameters of intrinsic silicon at 300 K including temperature coefficients”, Solar Energy Materials and Solar Cells, vol. 92, pp. 1305–1310, 2008.
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