TY - JOUR T1 - Coulomb-enhanced Auger recombination in crystalline silicon at intermediate and high injection densities JF - Journal of Applied Physics Y1 - 2000 A1 - Jan Schmidt A1 - Mark J Kerr A1 - Pietro P Altermatt KW - Auger effect KW - carrier lifetime KW - electron-hole recombination KW - elemental semiconductors KW - photoconductivity KW - SILICON PB - AIP VL - 88 UR - http://link.aip.org/link/?JAP/88/1494/1 KW - Schmidt2000 ER -