01116nas a2200205 4500008004100000245006000041210006000101300001600161490000700177520052000184653001000704653001600714653002300730653001500753100001900768700002000787700002100807700001900828856006300847 2004 eng d00aElectronic color charts for dielectric films on silicon0 aElectronic color charts for dielectric films on silicon a1464–14690 v123 a
This paper presents the calculation of the perceived color of dielectric films on silicon. A procedure is shown for computing the perceived color for an arbitrary light source, light incident angle, and film thickness. The calculated color is converted into {RGB} parameters that can be displayed on a color monitor, resulting in the generation of electronic color charts for dielectric films. This paper shows generated electronic color charts for both silicon dioxide and silicon nitride films on silicon.
10aColor10ameasurement10aoptical properties10aThin films1 aHenrie, Justin1 aKellis, Spencer1 aSchultz, Stephen1 aHawkins, Aaron uhttp://www.opticsexpress.org/abstract.cfm?URI=oe-12-7-146400437nas a2200121 4500008004100000245010600041210006900147300001200216490001000228100001400238700001400252856004900266 1977 eng d00aElectronic processes at grain boundaries in polycrystalline semiconductors under optical illumination0 aElectronic processes at grain boundaries in polycrystalline semi a397-4020 vED-241 aCard, H C1 aYang, E S uhttps://www.pveducation.org/zh-hans/node/29200369nas a2200121 4500008004100000245004500041210004400086260003900130300000800169490000700177100001400184856004900198 1952 eng d00aElectron-Hole Recombination in Germanium0 aElectronHole Recombination in Germanium bAmerican Physical Societyc07/1952 a3870 v871 aHall, R N uhttps://www.pveducation.org/zh-hans/node/32400392nam a2200097 4500008004100000245008600041210006900127260002700196100002200223856004900245 1950 eng d00aElectrons and holes in semiconductors with applications to transistor electronics0 aElectrons and holes in semiconductors with applications to trans aNew Yorkbvan Nostrand1 aShockley, William uhttps://www.pveducation.org/zh-hans/node/38000393nas a2200109 4500008004100000245008400041210006900125300001400194490000700208100001900215856004900234 1918 eng d00aEin neues Verfahren zur Messung der Kristallisationsgeschwindigheit der Metalle0 aEin neues Verfahren zur Messung der Kristallisationsgeschwindigh a219–2210 v921 aCzochralski, J uhttps://www.pveducation.org/zh-hans/node/298