Accurate measurements of the silicon intrinsic carrier density from 78 to 340 K

Submitted by stuart on Fri, 05/24/2013 - 06:08

K. Misiakos и Tsamakis, D., «Accurate measurements of the silicon intrinsic carrier density from 78 to 340 K», Journal of Applied Physics, т. 74, № 5, с. 3293, 1993.

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