Submitted by drupal on Sat, 04/28/2012 - 22:47 W. R. Thurber, Mattis,, Liu,, и Filliben, «The Relationship Between Resistivity and Dopant Density for Phosphorus- and Boron-Doped Silicon». U.S. Department of Commerce National Bureau of Standards, 1981. Log in or register to post comments BibTeX RTF Tagged MARC EndNote XML RIS