Annealing effects on the properties of copper oxide thin films prepared by chemical deposition

Submitted by stuart on Sat, 08/06/2016 - 15:17

N. Serin, Serin, T., Horzum, Ş., and Çelik, Y., “Annealing effects on the properties of copper oxide thin films prepared by chemical deposition”, Semiconductor Science and Technology, vol. 20, p. 398, 2005.

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