Annealing effects on the properties of copper oxide thin films prepared by chemical deposition

Submitted by stuart on Sun, 01/26/2014 - 13:00

N. Serin, Serin, ülay, Horzum, Ş., and Çelik, Y., “Annealing effects on the properties of copper oxide thin films prepared by chemical deposition”, Semiconductor Science and Technology, vol. 20, no. 5, pp. 398 - 401, 2005.

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