Submitted by stuart on Fri, 01/24/2014 - 14:53 F. Vazquez, Forman, R., and Cardona, M., “Electroreflectance Measurements on Mg2Si, Mg2Ge, and Mg2Sn”, Physical Review, vol. 176, no. 3, pp. 905 - 908, 1968. Log in or register to post comments DOI BibTeX RTF Tagged MARC EndNote XML RIS