Generalized analysis of quasi-steady-state and quasi-transient measurements of carrier lifetimes in semiconductors

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H. Nagel, Berge, C., 와/과 Aberle, A. G., “Generalized analysis of quasi-steady-state and quasi-transient measurements of carrier lifetimes in semiconductors”, Journal of Applied Physics, vol 86, pp 6218-6221, 1999.

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