@article {Pliskin1964,
title = {Nondestructive determination of thickness and refractive index of transparent films},
journal = {IBM Journal of Research Devices},
volume = {8},
number = {1},
year = {1964},
note = {
},
pages = {43{\textendash}51},
abstract = {
A simple nondestructive method of measuring the refractive index and thickness of transparent films on reflective substrates has been developed. The technique involves the use of a microscope equipped with a monochromatic filter on the objective and a stage that can be rotated so that the reflected light is observed at various angles. The film thickness, d, is given by d = {[\ΔN\λ]/[2\µ(cos} r2, - cos r1)], where \λ is the wavelength of the filtered light, \µ is the refractive index, and {\ΔN} is the number of fringes observed between the angles of refraction r2, and r1.
}, url = {http://portal.acm.org/citation.cfm?id=1662391}, author = {W. A. Pliskin and E. E. Conrad} }