@article {Pliskin1964,
	title = {Nondestructive determination of thickness and refractive index of transparent films},
	journal = {IBM Journal of Research Devices},
	volume = {8},
	number = {1},
	year = {1964},
	note = {<br />},
	pages = {43{\textendash}51},
	abstract = {<p> A simple nondestructive method of measuring the refractive index and thickness of transparent films on reflective substrates has been developed. The technique involves the use of a microscope equipped with a monochromatic filter on the objective and a stage that can be rotated so that the reflected light is observed at various angles. The film thickness, d, is given by d = {[\&Delta;N\&lambda;]/[2\&micro;(cos} r2, - cos r1)], where \&lambda; is the wavelength of the filtered light, \&micro; is the refractive index, and {\&Delta;N} is the number of fringes observed between the angles of refraction r2, and r1.</p>},
	url = {http://portal.acm.org/citation.cfm?id=1662391},
	author = {W. A. Pliskin and E. E. Conrad}
}
