Biblio

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S. J. Fonash, “Solar Cell Device Physics”, p. 400, 2010.
C. Gueymard, SMARTS2: a simple model of the atmospheric radiative transfer of sunshine: algorithms and performance assessment. Florida Solar Energy Center Cocoa, FL, 1995.
R. Corkish, Luke, K. L., Altermatt, P. P., and Heiser, G., “Simulating Electron-Beam-Induced Current Profiles Across p-n Junctions”, 16h European Solar Energy Conference. pp. 1590-1593, 2000.
R. Corkish, Luke, K. L., Altermatt, P. P., and Heiser, G., “Simulating Electron-Beam-Induced Current Profiles Across p-n Junctions”, in Proceedings of the 16h European Solar Energy Conference, Glasgow UK, 2000, pp. 1590-1593.
R. E. Bird and Riordan, C., “Simple Solar Spectral Model for Direct and Diffuse Irradiance on Horizontal and Tilted Planes at the Earth's Surface for Cloudless Atmospheres”, Journal of Climate and Applied Meteorology, vol. 25, no. 1, pp. 87 - 97, 1986.
J. Horzel, Szlufcik, J., Nijs, J., and Mertens, R., “A simple processing sequence for selective emitters”, Twenty Sixth IEEE Photovoltaic Specialists Conference. New York, NY, USA, pp. 139-142, 1997.
G. Willeke, Nussbaumer, H., Bender, H., and Bucher, E., “A simple and effective light trapping technique for polycrystalline silicon solar cells”, Solar Energy Materials and Solar Cells, vol. 26, pp. 345 - 356, 1992.
“Silicon and Ferrosilicon: Global Industry Markets and Outlook, 13th edition”, Roskill, London, 2011.
J. C. C. Tsai, “Shallow phosphorus diffusion profiles in silicon”, Proceedings of the IEEE, vol. 57, no. 9, pp. 1499 - 1506, 1969.
M. Wolf and Rauschenbach, H., “Series Resistance Effects on Solar Cell Measurements”, Advanced Energy Conversion, vol. 3, 1963.
A. Mette and et al, “Series resistance characterization of industrial silicon solar cells with screen-printed contacts using hotmelt paste”, Progress in Photovoltaics: Research and Applications, vol. 15, pp. 493-505, 2007.
D. King and Hansen, B., “A Sensitivity Analysis of the Spectral Mismatch Correction Procedure Using Wavelength-Dependent Error Sources”, 22nd IEEE PV Specialists Conference. 1991.
O. Madelung, Semiconductors Data Handbook. Berlin: Springer, 2004, p. 691.
O. Madelung, Semiconductors Data Handbook. Berlin: Springer, 2004, pp. 815-835.
D. Schroder, Semiconductor material and device characterization, 3rd editionrd ed. Piscataway NJ; Hoboken N.J.: IEEE Press; Wiley, 2006.
J. N. Shive, “Semiconductor Devices, Chapter 8”, New Jersey: Van Nostrand, 1959.
M. A. Green, “Self-consistent optical parameters of intrinsic silicon at 300 K including temperature coefficients”, Solar Energy Materials and Solar Cells, vol. 92, pp. 1305–1310, 2008.
R
S. Anandan, Wen, X., and Yang, S., “Room temperature growth of CuO nanorod arrays on copper and their application as a cathode in dye-sensitized solar cells”, Materials Chemistry and Physics, vol. 93, no. 1, pp. 35 - 40, 2005.
A. W. Blakers, Green, M. A., Leo, T., Outhred, H., and Robins, B., The Role of Photovoltaics in Reducing Greenhouse Gas Emissions. Canberra: Australian Government Publishing Service, 1991.
F. Kasten and Young, A. T., “Revised optical air mass tables and approximation formula”, Applied Optics, vol. 28, pp. 4735–4738, 1989.
D. PYSCH, Mette, A., and Glunz, S. W., “A review and comparison of different methods to determine the series resistance of solar cells”, Solar Energy Materials and Solar Cells, vol. 91, pp. 1698 - 1706, 2007.
C. A. Gueymard, “REST2: High-performance solar radiation model for cloudless-sky irradiance, illuminance, and photosynthetically active radiation – Validation with a benchmark dataset”, Solar Energy, vol. 82, no. 3, pp. 272 - 285, 2008.
W. R. Thurber, Mattis, R. L., Liu, Y. M., and Filliben, J. J., “Resistivity-Dopant Density Relationship for Phosphorus-Doped Silicon”, Journal of The Electrochemical Society, vol. 127, pp. 1807-1812, 1980.
W. R. Thurber, Mattis, R. L., Liu, Y. M., and Filliben, J. J., “Resistivity-Dopant Density Relationship for Boron-Doped Silicon”, Journal of The Electrochemical Society, vol. 127, pp. 2291-2294, 1980.
W. R. Thurber, Mattis,, Liu,, and Filliben, “The Relationship Between Resistivity and Dopant Density for Phosphorus- and Boron-Doped Silicon”. U.S. Department of Commerce National Bureau of Standards, 1981.

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