Biblio

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Q
R. A. Sinton and Cuevas, A., “A Quasi-Steady-State Open-Circuit Voltage Method for Solar Cell Characterization”, in 16th European Photovoltaic Solar Energy Conference, Glasgow, Scotland, 2000, pp. 1152–1155.
R
A. Cuevas, “The Recombination Parameter J0”, Energy Procedia, vol. 55, pp. 53 - 62, 2014.
S
R. Corkish, Luke, K. L., Altermatt, P. P., and Heiser, G., “Simulating Electron-Beam-Induced Current Profiles Across p-n Junctions”, in Proceedings of the 16h European Solar Energy Conference, Glasgow UK, 2000, pp. 1590-1593.
R. Corkish, Luke, K. L., Altermatt, P. P., and Heiser, G., “Simulating Electron-Beam-Induced Current Profiles Across p-n Junctions”, 16h European Solar Energy Conference. pp. 1590-1593, 2000.
M. Calixto-Rodriguez, Martinez, H., Sanchez-Juarez, A., Campos-Alvarez, J., Tiburcio-Silver, A., and Calixto, M. E., “Structural, optical, and electrical properties of tin sulfide thin films grown by spray pyrolysis”, Thin Solid Films, vol. 517, no. 7, pp. 2497 - 2499, 2009.
M. Calixto-Rodriguez, Martinez, H., Sanchez-Juarez, A., Campos-Alvarez, J., Tiburcio-Silver, A., and Calixto, M. E., “Structural, optical, and electrical properties of tin sulfide thin films grown by spray pyrolysis”, Thin Solid Films, vol. 517, no. 7, pp. 2497 - 2499, 2009.
M. Calixto-Rodriguez, Martinez, H., Sanchez-Juarez, A., Campos-Alvarez, J., Tiburcio-Silver, A., and Calixto, M. E., “Structural, optical, and electrical properties of tin sulfide thin films grown by spray pyrolysis”, Thin Solid Films, vol. 517, no. 7, pp. 2497 - 2499, 2009.
M. Botero, P. Perez, B., Calderon, C., Romero, E., and Gordillo, G., “Study of SnS:Bi thin films prepared by sulfurization”, in 2009 34th IEEE Photovoltaic Specialists Conference (PVSC)2009 34th IEEE Photovoltaic Specialists Conference (PVSC), Philadelphia, PA, USA, 2009.
T
M. J. Stocks, Carr, A. J., and Blakers, A. W., “Texturing of polycrystalline silicon”, Solar Energy Materials and Solar Cells, vol. 40, pp. 33 - 42, 1996.
U
W. L. Bailey, Coleman, M. G., Harris, C. B., and Lesk, I. A., “United States Patent: 4137123 - Texture etching of silicon: method”. 1979.
D. Macdonald, Sinton, R. A., and Cuevas, A., “On the use of a bias-light correction for trapping effects in photoconductance-based lifetime measurements of silicon”, Journal of Applied Physics, vol. 89, pp. 2772-2778, 2001.

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