Biblio

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2005
N. Serin, Serin, ülay, Horzum, Ş., and Çelik, Y., Annealing effects on the properties of copper oxide thin films prepared by chemical deposition, Semiconductor Science and Technology, vol. 20, no. 5, pp. 398 - 401, 2005.
N. Serin, Serin, T., Horzum, Ş., and Çelik, Y., Annealing effects on the properties of copper oxide thin films prepared by chemical deposition, Semiconductor Science and Technology, vol. 20, p. 398, 2005.
N. Serin, Serin, ülay, Horzum, Ş., and Çelik, Y., Annealing effects on the properties of copper oxide thin films prepared by chemical deposition, Semiconductor Science and Technology, vol. 20, no. 5, pp. 398 - 401, 2005.
N. Serin, Serin, T., Horzum, Ş., and Çelik, Y., Annealing effects on the properties of copper oxide thin films prepared by chemical deposition, Semiconductor Science and Technology, vol. 20, p. 398, 2005.
R. M. Swanson, Approaching the 29% limit efficiency of silicon solar cells, Thirty-First IEEE Photovoltaic Specialists Conference. 01/2005, Lake buena Vista, FL, USA, pp. 889-94, 2005.
N. Sato, Ichimura, M., Arai, E., and Yamazaki, Y., Characterization of electrical properties and photosensitivity of SnS thin films prepared by the electrochemical deposition method, Solar Energy Materials and Solar Cells, vol. 85, no. 2, pp. 153 - 165, 2005.
K. Bothe, Sinton, R., and Schmidt, J., Fundamental boron-oxygen-related carrier lifetime limit in mono- and multicrystalline silicon, Progress in Photovoltaics: Research and Applications, vol. 13, pp. 287 - 296, 2005.
K. Bothe, Sinton, R., and Schmidt, J., Fundamental boron-oxygen-related carrier lifetime limit in mono- and multicrystalline silicon, Progress in Photovoltaics: Research and Applications, vol. 13, pp. 287 - 296, 2005.
M. Parhizkar et al., Nanocrystalline CuO films prepared by pyrolysis of Cu-arachidate LB multilayers, Colloids and Surfaces A: Physicochemical and Engineering Aspects, vol. 257-258, pp. 277 - 282, 2005.
M. Parhizkar et al., Nanocrystalline CuO films prepared by pyrolysis of Cu-arachidate LB multilayers, Colloids and Surfaces A: Physicochemical and Engineering Aspects, vol. 257-258, pp. 277 - 282, 2005.

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