Biblio

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M
G. Masetti, Severi, M., and Solmi, S., “Modeling of carrier mobility against carrier concentration in arsenic-, phosphorus-, and boron-doped silicon”, IEEE Transactions on Electron Devices, vol. ED-30, pp. 764–9, 1983.
R. Perez, Ineichen, P., Seals, R., Michalsky, J., and Stewart, R., “Modeling daylight availability and irradiance components from direct and global irradiance”, Solar Energy, vol. 44, pp. 271 - 289, 1990.
R. Perez, Ineichen, P., Seals, R., Michalsky, J., and Stewart, R., “Modeling daylight availability and irradiance components from direct and global irradiance”, Solar Energy, vol. 44, pp. 271–289, 1990.
C. H. Wang, Misiakos, K., and Neugroschel, A., “Minority-carrier transport parameters in n-type silicon”, IEEE Transactions on Electron Devices, vol. 37, pp. 1314 - 1322, 1990.
M. A. Green, King, F. D., and Shewchun, J., “Minority carrier MIS tunnel diodes and their application to electron- and photo-voltaic energy conversion—I. Theory”, Solid-State Electronics, vol. 17, no. 6, pp. 551 - 561, 1974.
L. A. Corathers, “Minerals Yearbook, Vol. I, Metals & Minerals:”. U.S. Government Printing Office, p. 144, 2013.
M. Devika et al., “Microstructure dependent physical properties of evaporated tin sulfide films”, Journal of Applied Physics, vol. 100, no. 2, p. 023518, 2006.
F. Dimroth et al., “METAMORPHIC GaInP/GaInAs/Ge TRIPLE-JUNCTION SOLAR CELLS WITH > 41 % EFFICIENCY”, 34th IEEE Photovoltaic Specialists Conference. 2009.
A. E. Becquerel, “Memoire sur les effects d´electriques produits sous l´influence des rayons solaires”, Annalen der Physick und Chemie, vol. 54, pp. 35-42, 1841.
I. Astronomic Union, “Measuring the Universe”, 2012. .
M. Emilio, Kuhn, J. R., Bush, R. I., and Scholl, I. F., “MEASURING THE SOLAR RADIUS FROM SPACE DURING THE 2003 AND 2006 MERCURY TRANSITS”, The Astrophysical Journal, vol. 750, no. 2, p. 135, 2012.
E. G. Laue, “The measurement of solar spectral irradiance at different terrestrial elevations”, Solar Energy, vol. 13, pp. 43 - 50, IN1-IN4, 51-57, 1970.
F. M. Smits, “Measurement of sheet resistivities with the four-point probe”, Bell System Technical Journal, vol. 34, pp. 711-718, 1958.
G. S. Brady, Clauser, H. R., and Vaccari, J. A., Materials handbook: [foundation for the science of metallurgy; compares the advantages and disadvantages of different manufacturing processes; comprehensive in approach]. New York [u.a.]: {McGraw-Hill}, 2002.
A. S. H. van der Heide and et al, “Mapping of contact resistance and locating shunts on solar cells using Resistance Analysis by Mapping of Potential (RAMP) techniques”, 16th European Photovoltaic Solar Energy Conference. Glasgow (United Kingdom), p. 1438, 2000.