Biblio

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2000
K. K. Anwar, Aluminium Back Surface Field in Buried Contact Solar Cells, University of New South Wales, 2000.
J. Schmidt, Kerr, M. J., and Altermatt, P. P., Coulomb-enhanced Auger recombination in crystalline silicon at intermediate and high injection densities, Journal of Applied Physics, vol. 88, pp. 1494-1497, 2000.
K. R. McIntosh and Honsberg, C. B., The Influence of Edge Recombination on a Solar Cell’s IV Curve, 16th European Photovoltaic Solar Energy Conference. 2000.
A. S. H. van der Heide and et al, Mapping of contact resistance and locating shunts on solar cells using Resistance Analysis by Mapping of Potential (RAMP) techniques, 16th European Photovoltaic Solar Energy Conference. Glasgow (United Kingdom), p. 1438, 2000.
M. J. O’Neil and McDanal, A. J., Outdoor measurement of 28% efficiency for a mini-concentrator module, National Center for Photovoltaics Program Review Meeting. Denver, USA, 2000.
K. Hyun Yoon, Choi, W. Jin, and Kang, D. Heon, Photoelectrochemical properties of copper oxide thin films coated on an n-Si substrate, Thin Solid Films, vol. 372, pp. 250 - 256, 2000.
R. A. Sinton and Cuevas, A., A Quasi-Steady-State Open-Circuit Voltage Method for Solar Cell Characterization, in 16th European Photovoltaic Solar Energy Conference, Glasgow, Scotland, 2000, pp. 1152–1155.
R. Corkish, Luke, K. L., Altermatt, P. P., and Heiser, G., Simulating Electron-Beam-Induced Current Profiles Across p-n Junctions, 16h European Solar Energy Conference. pp. 1590-1593, 2000.
R. Corkish, Luke, K. L., Altermatt, P. P., and Heiser, G., Simulating Electron-Beam-Induced Current Profiles Across p-n Junctions, in Proceedings of the 16h European Solar Energy Conference, Glasgow UK, 2000, pp. 1590-1593.
T. Markvart, Solar Electricity, p. 271, 2000.
B. G. Streetman, Solid State Electronic Devices. Prentice Hall, 2000.
A. Rumberg, Sommerhalter, C., Toplak, M., Jäger-Waldau, A., and Lux-Steiner, M. C., ZnSe thin films grown by chemical vapour deposition for application as buffer layer in CIGSS solar cells, Thin Solid Films, vol. 361-362, pp. 172 - 176, 2000.

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