%0 Journal Article
%J Colloids and Surfaces A: Physicochemical and Engineering Aspects
%D 2005
%T Nanocrystalline CuO films prepared by pyrolysis of Cu-arachidate LB multilayers
%A Parhizkar, M.
%A Singh, Sukhvinder
%A Nayak, P.K.
%A Kumar, Nigvendra
%A Muthe, K.P.
%A Gupta, S.K.
%A Srinivasa, R.S.
%A Talwar, S.S.
%A Major, S.S.
%B Colloids and Surfaces A: Physicochemical and Engineering Aspects
%V 257-258
%P 277 - 282
%8 Jan-05-2005
%G eng
%U http://linkinghub.elsevier.com/retrieve/pii/S0927775704007320
%! Colloids and Surfaces A: Physicochemical and Engineering Aspects
%R 10.1016/j.colsurfa.2004.10.029
%0 Conference Proceedings
%B 17th European Photovoltaic Solar Energy Conference
%D 2001
%T Natural Sunlight Calibration of Silicon Solar Cells.
%A W. Keogh
%A Andrew W Blakers
%B 17th European Photovoltaic Solar Energy Conference
%C Munich, Germany
%G eng
%0 Conference Proceedings
%B 17th European Photovoltaic Solar Energy Conference
%D 2001
%T A New Generalized Detailed Balance Formulation to Calculate Solar Cell Efficiency Limits
%A Christiana B Honsberg
%A R. Corkish
%A S. P. Bremner
%B 17th European Photovoltaic Solar Energy Conference
%P 22-26
%G eng
%0 Journal Article
%J Solar energy materials and solar cells
%D 1999
%T Na incorporation in Mo and CuInSe_{2} from production processes
%A Rockett, Angus
%A Granath, Karin
%A Asher, S
%A Al Jassim, MM
%A Hasoon, F
%A Matson, R
%A Basol, B
%A Kapur, V
%A Britt, JS
%A Gillespie, T
%A others
%B Solar energy materials and solar cells
%V 59
%P 255–264
%G eng
%0 Conference Paper
%B Proceedings of the 23rd IEEE Photovoltaic Specialists Conference
%D 1993
%T A New Method for the Accurate Measurements of the Lumped Series Resistance of Solar Cells
%A Armin G Aberle
%A Wenham, S.R.
%A Martin A Green
%B Proceedings of the 23rd IEEE Photovoltaic Specialists Conference
%C Louisville, KY
%G eng
%0 Journal Article
%J Electron Devices, IEEE Transactions on
%D 1990
%T Numerical modeling of textured silicon solar cells using PC-1D
%A Basore, P.A.
%K elemental semiconductors
%K finite element analysis
%K finite-element program
%K front-surface recombination
%K heavy doping
%K high-level injection
%K internal performance
%K light trapping
%K microcomputer applications
%K modeling semiconductor devices
%K multidimensional effects
%K nonplanar structures
%K numerical models
%K oblique photon path angles
%K PC-1D
%K PC-1D Version 2
%K personal computers
%K semiconductor device models
%K semiconductors
%K Si
%K SILICON
%K solar cells
%K spectral quantum efficiency data
%K textured solar cells
%K transients
%X PC-1D is a quasi-one-dimensional finite-element program for modeling semiconductor devices on personal computers. The program offers solar cell researchers a convenient user interface with the ability to address complex issues associated with heavy doping, high-level injection, nonplanar structures, and transients. The physical and numerical models used in PC-1D Version 2 that make it possible to approximate the multidimensional effects found in textured crystalline silicon solar cells, including the effects of increased front-surface recombination, oblique photon path angles, and light trapping, are presented. As an example of how the model can be applied, PC-1D is used to investigate the interpretation of spectral quantum efficiency data as a tool for diagnosing the internal performance of textured silicon solar cells
%B Electron Devices, IEEE Transactions on
%V 37
%P 337 -343
%8 02/1990
%G eng
%R 10.1109/16.46362
%0 Journal Article
%J IBM Journal of Research Devices
%D 1964
%T Nondestructive determination of thickness and refractive index of transparent films
%A W. A. Pliskin
%A E. E. Conrad
%X A simple nondestructive method of measuring the refractive index and thickness of transparent films on reflective substrates has been developed. The technique involves the use of a microscope equipped with a monochromatic filter on the objective and a stage that can be rotated so that the reflected light is observed at various angles. The film thickness, d, is given by d = {[ΔNλ]/[2µ(cos} r2, - cos r1)], where λ is the wavelength of the filtered light, µ is the refractive index, and {ΔN} is the number of fringes observed between the angles of refraction r2, and r1.

%B IBM Journal of Research Devices
%V 8
%P 43–51
%G eng
%U http://portal.acm.org/citation.cfm?id=1662391
%0 Journal Article
%J Journal of Applied Physics
%D 1954
%T A New Silicon P-N Junction Photocell for Converting Solar Radiation into Electrical Power
%A Chapin, D.M.
%A Fuller, C.S.
%A Pearson, G.L.
%B Journal of Applied Physics
%V 25
%P 676-677
%G eng
%0 Journal Article
%J The Mathematical Gazette
%D 1921
%T Note on the Equation, of Time
%A Milne, R. M.
%B The Mathematical Gazette
%V 10
%P 372 - 375
%8 Jan-12-1921
%G eng
%U https://www.cambridge.org/core/product/identifier/S0025557200232944/type/journal_articlehttps://www.cambridge.org/core/services/aop-cambridge-core/content/view/S0025557200232944
%N 155
%! Math. Gaz.
%R 10.1017/S0025557200232944
%0 Journal Article
%J American J. of Science
%D 1883
%T On a New Form of Selenium Photocell
%A Fritts, C.E.
%B American J. of Science
%V 26
%P 465
%G eng