%0 Journal Article %J Journal of Applied Physics %D 2000 %T Coulomb-enhanced Auger recombination in crystalline silicon at intermediate and high injection densities %A Jan Schmidt %A Mark J Kerr %A Pietro P Altermatt %K Auger effect %K carrier lifetime %K electron-hole recombination %K elemental semiconductors %K photoconductivity %K SILICON %B Journal of Applied Physics %I AIP %V 88 %P 1494-1497 %G eng %U http://link.aip.org/link/?JAP/88/1494/1 %R 10.1063/1.373878