TY - JOUR T1 - Annealing effects on the properties of copper oxide thin films prepared by chemical deposition JF - Semiconductor Science and Technology Y1 - 2005 A1 - Serin, Necmi A1 - Serin, ülay A1 - Şeyda Horzum A1 - Çelik, Yasemin VL - 20 UR - http://stacks.iop.org/0268-1242/20/i=5/a=012?key=crossref.e80ad675d4be3b601f49e0d1d5cceb0d CP - 5 J1 - Semicond. Sci. Technol. KW - Serin2005 ER -