01055nas a2200133   4500008004100000245008800041210006900129300001200198490000600210520062200216100001700838700001600855856005000871       1964                        eng d00aNondestructive determination of thickness and refractive index of transparent films0 aNondestructive determination of thickness and refractive index o  a43–510 v83 a<p> A simple nondestructive method of measuring the refractive index and thickness of transparent films on reflective substrates has been developed. The technique involves the use of a microscope equipped with a monochromatic filter on the objective and a stage that can be rotated so that the reflected light is observed at various angles. The film thickness, d, is given by d = {[&Delta;N&lambda;]/[2&micro;(cos} r2, - cos r1)], where &lambda; is the wavelength of the filtered light, &micro; is the refractive index, and {&Delta;N} is the number of fringes observed between the angles of refraction r2, and r1.</p>1 aPliskin, W A1 aConrad, E E  uhttp://portal.acm.org/citation.cfm?id=1662391