@article {Macdonald2001,
	title = {On the use of a bias-light correction for trapping effects in photoconductance-based lifetime measurements of silicon},
	journal = {Journal of Applied Physics},
	volume = {89},
	number = {5},
	year = {2001},
	pages = {2772-2778},
	publisher = {AIP},
	keywords = {CARRIER DENSITY, carrier lifetime, electron traps, electron-hole recombination, elemental semiconductors, hole traps, photoconductivity, SILICON, solar cells},
	doi = {10.1063/1.1346652},
	url = {http://link.aip.org/link/?JAP/89/2772/1},
	author = {Daniel Macdonald and Ronald A. Sinton and Andr{\'e}s Cuevas}
}
